All, I do not expect to be able to attend an ATM meeting until Dec 15. I read last weeks minutes and cam up with an idea that might solve many of the issues that we have been suffering through: We are all aware of the difficulty of introducing new features to IBIS (e.g. C_Comp, Derating, Masks, USB rules, JEDEC rules, On Die S-parameters, LTI Differential Tx and Rx models, .). I would like to propose a simple solution that I think will solve this problem by introducing a single new keyword to IBIS "[Specification]". The format of a [Specification] record is simply: [Specification] specification_name [Specification] records can occur in the [Component] section, or [Model] section. Each component and each model may have multiple [Specification] records. A specification_name can either be registered. It is registered by being placed in an IBIS maintained registry of registered names along with a specification_name.txt or specification_name.pdf document describing the specification. If a specification_name is not registered, then the specification_name.txt or specification_name.pdf needs to be supplied along with the IBIS file. I think the following example will explain the usefulness of this concept. Consider a 667 MegHz, DDR2 memory part with the following models: CLKIN, ADDCMD, DQ, DQS. The IBIS file might be: [Model] CLKIN [Specification] DDR2_667_CLKIN [Model] ADDCMD [Specification] DDR2_667_ ADDCMD [Model] DQ [Specification] DDR2_667_DQ [Model] DQS [Specification] DDR2_667_DQS_diff The IBIS registry would contain the following entries for DDR2 667MegHz. There would be other entries for other speed grades, DDR3, DDR4, . DDR2_667_CLKIN DDR2_667_CLKIN.txt DDR2_667_ ADDCMD DDR2_667_ ADDCMD.txt DDR2_667_DQ DDR2_667_DQ.txt DDR2_667_DQS_diff DDR2_667_DQS_diff.txt DDR2_667_CLKIN.txt might contain JEDEC Standard No. 79-2C Speed grade 667MegHz Signal CK This is sufficient information for an EDA tool to create a design kit for this model. It will be up to the EDA tool to determine how it implements this in its environment. Similarly there can be [Specification] for eye masks, on die s-parameters, "ladder C_comp", . EDA tool vendors can implement solutions to each of these problems in an appropriate way based on their target market and their tool capabilities. The key point is that [Specification] allows IC vendors to document in their IBIS [Model]s the measurement/simulation requirements of their models without waiting for IBIS to come up with new keywords/parameters, and allows EDA vendors to address industry standard measurement rules in a timely manor. USB, JEDEC, and other industry standard specifications fit naturally into this scheme. Fancy C_Comp solutions can be more problematic, since the [Specification] might be ties to a specific simulation methodology or EDA tool, but it would at least document the solution used by the IC vendor for their analysis. I would expect that IC vendors will learn to write these [Specifications] in a way that would be supported by the EDA tools that their customers use. Walter Katz Chief Scientist Signal Integrity Software, Inc. wkatz@xxxxxxxxxx 303.449-2308